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Carl Zeiss – Axio A1m Imager

Light microscope

Carl Zeiss – Axio M1m Imager

Light microscope with quantitative image analysis for optical characterization

Carl Zeiss – SteREO

Stereo microscope for three-dimensional surface characterization

FEI – Helios NanoLab 600i FIB Workstation

High-resolution scanning electron microscope with field emission source and integrated FIB technique for in-situ sample preparation

Large-chamber scanning electron microscope

In-situ observation of deformation and failure analysis of large parts

Olympus – Lext OLS 4000

Laser measuring microscope for contactless surface characterization

NT-MDT – Solver Pro SPM Platform

Topological characterization of nano-scaled materials